Surface Analysis Techniques: STM, AFM, and Tribocorrosion
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Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM)
Scanning Tunneling Microscopy (STM)
Scanning Tunneling Microscopy (STM) is an instrument used for imaging surfaces at the atomic level, revealing the topography of conductive specimens. It measures tunneling current and can be used in air, water, and various gas environments, at temperatures ranging from near zero Kelvin to a few hundred degrees Celsius. STM operates in two modes: constant interaction mode and constant height mode.
Advantages of STM
- High resolution, not limited by diffraction
- Small sample size
- Can modify samples to create small structures
- Does not require a partial vacuum
Disadvantages of STM
- Difficult to determine detailed shapes
- Slow scanning speed
- Small image sizes
- Not